FILTER PRODUCTS

to
to
to
EpiCurve TT Curvature Measurement System
LayTec AG
To overcome the challenges that occur with larger wafers (4\", 6\" or 8\"), you need the advanced EpiCurve® TT system. It combines wafer curvature measurements with all the features of the EpiTT:emissivity-corrected pyrometry and growth rate/thickness measurements by three-wavelength reflectance. This tool will help you avoid ...
  • Index Measurement Range: 3 - 20
  • Accuracy: -1 - 1
  • Repeatability: 1 - 1
Data Sheet
EpiTT Product Family
LayTec AG
EpiTT combines measurements of temperature and  reflectance at three wavelengths in one tool. For True Temperature (TT), we apply the method of Emissivity Corrected Pyrometry, which delivers the precise surface temperatures of opaque materials at 950 nm (Si, GaAs, InP). For materials that are transparent at 950 nm (GaN, ...
  • Index Measurement Range: 3 - 20
  • Accuracy: 1 - 1
  • Repeatability: 1 - 1
Data Sheet
XPLOR-100 3D Optical Inspection Station
M3 Measurement Solutions
XPLOR 100 is a state of the art, fully automated metrology device designed for measurement and analysis of bubbles and inclusions for optical substrates in the Visible and NIR wave-bands.
  • Index Measurement Range: 400 - 1000
  • Accuracy: -0.001 - 0.001
  • Repeatability: -0.001 - 0.001
Data Sheet
PRISM PRO IR REFRACTOMETER
M3 Measurement Solutions
The Prism Pro - IR is a state of the art Infrared Refractometer. It is the ideal instrument for characterizing infrared material properties of dispersion and refractive index.
  • Index Measurement Range: 1000 - 14000
  • Accuracy: -0.00002 - 0.00002
  • Repeatability: -0.00005 - 0.00005
Data Sheet
Precision Spectrometers GMR-1D
Shimadzu Corp
Angle and Refractive Index Measurement System from UV Range to Near-IR Range.
  • Index Measurement Range: 1.20 - 2.05
  • Accuracy: -0.0001 - 0.0001
  • Repeatability: -0.000001 - 0.000001
Data Sheet
Kalnew Precision Refractometer KPR-300
Shimadzu Corp
With the V-block method, samples finished to a 90 degree angle are measured. The instrument is capable of high-accuracy measurements (in comparison to the Abbe method (critical angle method)), with a measurement accuracy of ±4 × 10-5, and a display resolution of 0.1 × 10-5. The finished surface of the sample does not require the ...
  • Index Measurement Range: 1.20 - 2.05
  • Accuracy: -0.00004 - 0.00004
  • Repeatability: -0.00001 - 0.00001
Data Sheet