FILTER PRODUCTS

to
to
to
to
to
PV-SI BIREFRINGENCE MEASUREMENT SYSTEM
Hinds Instruments Inc
During the production of Si solar panels, stress in Si crystals often remains undetected long into the fabrication process. Hinds Instruments has developed a stress birefringence instrument for measuring Si ingots, either squared or as-grown, before they are sawed into wafers. When this instrument is used as a QC tool, low quality Si ...
  • Retardation Range: 0.1 - 775 nm
  • Max Measurement Rate: 100 PPS
  • Light Source Wavelength: -- nm
  • Measurement Area Length: 500 mm
  • Measurement Area Width: 150 mm
Data Sheet
Exicor OIA Premier Birefringence Measurement System
Hinds Instruments Inc
The Hinds™ Instruments Exicor® OIA is the Premier Birefringence Measurement System for the evaluation of Lenses, Parallel Faced Optics and Curved Optics at normal and oblique incident angles. The system is built on Hinds Instruments award winning Photoelastic Modulator (PEM) based Exicor Birefringence Measurement ...
  • Retardation Range: 0 - 300 nm
  • Max Measurement Rate: -- PPS
  • Light Source Wavelength: 632.8 nm
  • Measurement Area Length: 320 mm
  • Measurement Area Width: 320 mm
Data Sheet
GEN SERIES BIREFRINGENCE MEASUREMENT SYSTEM
Hinds Instruments Inc
The Exicor® GEN5 and GEN6 systems are large format sample measurement units built on the core Exicor low level birefringence measurement technology and precision automated motion control elements.  These platforms provide unsurpassed low level birefringence measurements to support the precision characterization of display ...
  • Retardation Range: 0.005 - 300 nm
  • Max Measurement Rate: 100 PPS
  • Light Source Wavelength: 632.8 nm
  • Measurement Area Length: 1 mm
  • Measurement Area Width: 1 mm
Data Sheet