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Using a standard microscope for luminescence characterization often means inefficient fiber-optic coupling to the spectrometer, and difficult access for many sample configurations, such as side-emitting devices, or upright cryostats. Nor do standard microscopes offer flexibility for coupling multiple lasers for photoluminescence ...
  • Spectral Range: 200 - 1600 nm
  • Spectral Resolution: 0.1 nm
  • Detection Spectral Range: 190 - 1600 nm
  • Excitation Laser Wavelength: 785nm
  • Magnification: 100 
  • ...
Data Sheet
Using a standard microscope for luminescence characterization often means inefficient fiber-optic coupling to the spectrometer, and difficult access for many sample configurations, such as side-emitting devices, or upright cryostats. Nor do standard microscopes offer flexibility for coupling multiple lasers for photoluminescence ...
  • Spectral Range: 200 - 1600 nm
  • Spectral Resolution: 0.18 nm
  • Detection Spectral Range: 200 - 1050 nm
  • Excitation Laser Wavelength: 532nm
  • Magnification: 10 
  • ...
Data Sheet
Photon Etc. offers complex material analysis (GaAs, SiC, CdTe, CIS, CIGS) using hyperspectral imaging of diffuse reflectance, photoluminescence and electroluminescence. Our technology is based on high throughput global imaging filters, faster and more efficient than spectrograph based hyperspectral systems. Imaging from 400 to 1000 ...
  • Spectral Range: 400 - 1700 nm
  • Spectral Resolution: <2.5 or <4 nm
  • Detection Spectral Range: 400 - 1650 nm
  • Excitation Laser Wavelength: Other, 808nm, 785nm, 532nm
  • Magnification: 20x, 50x, 60x, 100x 
  • ...
Data Sheet