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Duma\'s High Power Laser Measuring Device is a robust all-in-one instrument with built-in state-of-the-art air-cooled beam dump, operating from 350 - 1600 nm lasers. It will measure M², BPP (Beam Propagation Parameters), Beam size at its focal position down to less than 100 microns. A unique feature allows measurement of ...
  • Detector Type: Si
  • Wavelength Range: 350 - 1100 nm
  • Beam Waist Diameter Measurement: User Selectable % Width, 1/e^2 Width, Second Moment (4s) Diameter, Fitted Gaussian and Top-Hat
  • M^2 Measurement Capability: Yes
Data Sheet
The measuring technique is based on a multiple scanning knife-edge technology, combined with a tomographic image reconstruction for the creation of the 2D/3D display. When the drum spins, the knife-edges cut across the beam in an orthogonal plane to the direction of propagation. A stationary large detector inside the spinning drum ...
  • Detector Type: InGaAs, Si
  • Wavelength Range: 190 - 2700 nm
  • Beam Waist Diameter Measurement: User Selectable % Width, 1/e^2 Width, Fitted Gaussian and Top-Hat, Second Moment (4s) Diameter
  • M^2 Measurement Capability: Yes
Data Sheet
The M² Beam provides analytical and graphical capability to measure the 2 axis M² figure of merit waist size and location of CW lasers. The M² factor is measured in accordance with the proposed ISO/CD 11 146.Additionaly, the instrument measures the profile width, position and power of the laser beam at intersection points along the ...
  • Detector Type: InGaAs, Si
  • Wavelength Range: 400 - 1800 nm
  • Beam Waist Diameter Measurement: User Selectable % Width, 1/e^2 Width, Fitted Gaussian and Top-Hat, Second Moment (4s) Diameter
  • M^2 Measurement Capability: Yes
Data Sheet
High precision beam diagnostics for CW lasers. A wide spectral range from deep UV through 2700nm. Wide dynamic range, beam size measurements down to 2 µm size and up to 10mm with 0.1 µm resolution. The new USB version offers enhanced operation of the Beam Analyzer series, including: USB 2.0 interface, 12 bit device, and ...
  • Detector Type: Si+InGaAs, InGaAs, Si
  • Wavelength Range: 350 - 2700 nm
  • Beam Waist Diameter Measurement: 1/e^2 Width, Fitted Gaussian and Top-Hat, Second Moment (4s) Diameter
  • M^2 Measurement Capability: No
Data Sheet
DataRay Inc offers the Beam\'R2 providing affordable, compact, and precise beam profiling with resolutions down to 0.1 µm. These profilers can be used with a wide variety of laser sources.
  • Detector Type: InGaAs, Si
  • Wavelength Range: 190 - 2500 nm
  • Beam Waist Diameter Measurement: User Selectable % Width, 1/e^2 Width, Fitted Gaussian and Top-Hat, Second Moment (4s) Diameter
  • M^2 Measurement Capability: Yes
Data Sheet
DataRay Inc offers the BeamScope-P8 providing affordable, compact, and precise beam profiling with resolutions to 2 µm. These profilers can be used with a wide variety of laser sources from 190nm to 3900nm depending on the model and detector type used. 
  • Detector Type: Other, Ge, Si+InGaAs, InGaAs, Si
  • Wavelength Range: 190 - 3900 nm
  • Beam Waist Diameter Measurement: Other, User Selectable % Width, 1/e^2 Width, Fitted Gaussian and Top-Hat, Second Moment (4s) Diameter
  • M^2 Measurement Capability: Yes
Data Sheet
DataRay Inc offers the BeamMap2-CM Collimator providing affordable, compact, and precise beam profiling with resolutions to 0.1 µm. These profilers can be used with a wide variety of laser sources from 190nm to 2500nm depending on the model. 
  • Detector Type: Other, Si+InGaAs, InGaAs, Si
  • Wavelength Range: 190 - 2500 nm
  • Beam Waist Diameter Measurement: Other, User Selectable % Width, 1/e^2 Width, Fitted Gaussian and Top-Hat
  • M^2 Measurement Capability: Yes
Data Sheet
DataRay Inc offers the BeamMap2 providing affordable, compact, and precise beam profiling with resolutions to 0.1 µm. These profilers can be used with a wide variety of laser sources from 190nm to 2500nm depending on the model. 
  • Detector Type: Other, Si+InGaAs, InGaAs, Si
  • Wavelength Range: 190 - 2500 nm
  • Beam Waist Diameter Measurement: Other, User Selectable % Width, 1/e^2 Width, Fitted Gaussian and Top-Hat
  • M^2 Measurement Capability: Yes
Data Sheet

Did You know?

Scanning-slit profilers use a narrow slit instead of a single knife edge. In this case, the intensity is integrated over the width of the slit. The resulting measurement is equivalent to the original cross section convolved with the profile of the slit. Scanning beam profilers are most suitable for beam profiles which are not too far from Gaussian, because the recorded signal is usually integrated in one spatial direction, so that the reconstruction of more structured beam shapes may not be perfect. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. An important advantage of the concept of scanning is that the photodetector used does not need to have a great spatial resolution, so that detectors for very different wavelength regions can easily be used.