Incoherent Light Sources
Charged Particle Sources
Optics Manufacturing
Optical Systems
Opto-Mechanics
Engineering Services
Spectral Analysis
Imaging and Vision
Metrology and Inspection
- Home
- Light Analysis
- Beam Characterization
- Shack-Hartman Wavefront Sensors
- SID4-sC8 HIGH RESOLUTION sCMOS QUANTITATIVE PHASE IMAGING CAMERA
SID4-sC8 HIGH RESOLUTION sCMOS QUANTITATIVE PHASE IMAGING CAMERA
OVERVIEW
Designed for life science and material inspection microscopes, SID4-sC8 brings fast, accurate and truly quantitative phase measurement in a compact, plug-and-play solution. Biologists will benefit from label-free cell imaging, high sensitivity and automatic segmentation, while material scientists will have access to accurate refractive index measurement, laser damage analysis and surface characterization.
SPECIFICATION
- Wavelength Range: 450 - 1000 nm
- # Pixels (Width): 852
- # Pixels (Height): 720
- Lenslet Pitch: 19.5 um
- Wavefront Accuracy: <= lambda/20
KEY FEATURES
sCMOS sensor
Single shot phase and intensity measurement
Magnification from x2.5 to x150
Compatible with acquisition software: Metamorph, Micromanager, NIS-Elements…
Imaging at any wavelength

Claim PHASICS Page to edit and add data
You may also like
-
SID4 HR WAVE FRONT SENSORPHASICS
-
Fast Shack-Hartmann Wavefront SensorJOAO Wavefront Sensing
-
PHOTONLOOP - Shack-Hartmann Wavefront SensorDYNAMIC OPTICS
-
WAVEFRONT SENSOR SH-InGaAs -292/468ALPAO
-
WAVEFRONT SENSOR SH-InGaAs -97ALPAO
-
WAVEFRONT SENSOR SH-InGaAs -69ALPAO
-
WAVEFRONT SENSOR SH-EMCCD- Fast -292/468ALPAO
-
WAVEFRONT SENSOR SH-EMCCD- Fast -97ALPAO
-
WAVEFRONT SENSOR SH-EMCCD- Fast -69ALPAO
-
WAVEFRONT SENSOR SH-EMCCDALPAO
-
WAVEFRONT SENSOR SH-CMOS-FastALPAO
-
WAVEFRONT SENSOR SH-CMOSALPAO
Don’t have an account?
Please consider registering
NOTE: It may take up to 10 min to receive the registration verification link. For immediate assistance please use the “GUEST” option above.