Line Laser Profiling System (LLPS)
Description
Line Laser Profiling System (LLPS)
Specifications |
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|---|---|
| Sensor Type: | CMOS |
| Measurable Sources: | CW, Pulsed |
| Wavelength Range: | 190-1150nm |
| # Pixels (Width): | 2048 |
| # Pixels (Height): | 2048 |
| Pixel Size (Width): | 5.5 um |
| Pixel Size (Height): | 5.5 um |
| Max Full Frame Rate: | 12 Hz |
| ADC: | 12-bit |
| Stage Length: | 50, 200, 500, and 1000 mm |
| Part Numbers: | LLPS-50-LCM, LLPS-200-LCM, LLPS-500-LCM, LLPS-1000-LCM |
Features
- Line laser length/width measurements
- Absolute vertical centroids
- Deviation of vertical centroids from a linear regression line
- Line tilt measured in degrees
- 50mm or 200 mm Translation Stage
- 190 to 1150 nm, CMOS detector o 4.2 MPixel, 2048 x 2048 pixels o 11.3 x 11.3 mm active area o 5.5 µm pixel size
- HyperCal™ – Dynamic Noise and Baseline Correction software
- 2,500:1 Signal to RMS Noise
- 12-bit ADC
- Window-free sensors standard to prevent fringing
- Global shutter allowing for pulsed or CW measurements
Applications
- Calibration
- Machine vision
- 3D Scanning
- Particle Counting
- Survey Instruments
- Bar code scanning
- Laser optics
- Metrology
- Rapid prototyping
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
Contact Supplier
How to order?
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Ships from:
United States
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Sold by:
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On FindLight:
since 2014
Frequently Asked Questions
The Line Laser Profiling System (LLPS) is a complete solution for analyzing line lasers up to 1000 mm in length and down to 55 µm in width.
The LLPS can provide line laser length/width measurements, absolute vertical centroids, deviation of vertical centroids from a linear regression line, and line tilt measured in degrees.
The CMOS detector used in the LLPS has a pixel size of 5.5 µm.
The LLPS software features include automatic exposure configuration, custom start/end locations, automatic PDF report generation, residual sensor tilt compensation, and the ability to export data to Excel or CSV.
The LLPS is suitable for a variety of applications including calibration, machine vision, 3D scanning, particle counting, survey instruments, bar code scanning, laser optics, metrology, and rapid prototyping.